IEEE and ODIN technologies Award Best RFID Paper
Las Vegas, NV, April 22, 2008 – The Institute of Electrical and Electronics Engineers (IEEE) and ODIN technologies announced the Best RFID Paper award winner for 2008, Tatsuya Inaba of the Keio Research Institute at Keio University in Japan. For the second straight year, ODIN technologies sponsored the award and is proud of its continuing relationship with IEEE. The award winning paper is selected by the members of the Program Committee and Organizing Committee for the IEEE International Conference on RFID 2008. The paper was selected from 124 entries, a 15% increase over 2007.
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